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News 18.07.2022
New publication: Charge-Induced Artifacts in Nonlocal Spin-Transport Measurements: How to Prevent Spurious Voltage Signals
![../../images/news/2022_PRA.png](../../images/news/2022_PRA.png)
Phys. Rev. Appl. 18, 014028 (2022) To conduct spin-sensitive transport measurements, a nonlocal device geometry is often used to avoid spurious voltages that are caused by the flow of charges. However, in the vast majority of reported nonlocal spin-valve, Hanle spin precession or spin Hall measurements, background signals have been observed that are not related to spins. We discuss seven different types of these charge-induced signals and explain how these artifacts can result in erroneous or misleading conclusions when falsely attributed to spin transport. The charge-driven signals can be divided into two groups: signals that are inherent to the device structure and/or the measurement setup and signals that depend on a common-mode voltage. We designed and built a voltage-controlled current source that significantly diminishes all spurious voltage signals of the latter group in both dc and ac measurements by creating a virtual ground within the nonlocal detection circuit. This is especially important for lock-in-based measurement techniques, where a common-mode voltage can create a phase-shifted, frequency-dependent signal with an amplitude several orders of magnitude larger than the actual spin signal. Measurements performed on graphene-based nonlocal spin-valve devices demonstrate how all spurious voltage signals that are caused by a common-mode voltage can be completely suppressed by such a current source.