Jointly with the Standardization Commission of the Graphene Flagship our institute (big thanks to Christoph Neumann and Jens Sonntag) have pushed through a new IEC standard for assessing the strain uniformity of single-layer graphene using Raman spectroscopy.

For more details see: IEC TS 62607-6-6 “Nanomanufacturing – Key control characteristics – Part 6-6: Graphene – Strain uniformity: Raman spectroscopy” https://webstore.iec.ch/publication/34162.